point engineering

Short buckling probes for high speed test

All the specifications could be optimized upon customer needs
Length Min 2.5mm length
Dimension 50*60um (90um pitch)
Beams Fine multi-beam structure
Materials Pd alloy, Au layered Materials electroplating
Options Insulation coating
Force 1.5 ~ 3.0 gf @ 3 mil
C.C.C.(ISMI) 1.0 ~ 2.5A @ 3 mil

Multi-beam buckling probes with high performance & Stability

All the specifications could be optimized upon customer needs
Min pitch 70um 90um 110um 130um 150um
Dimension 40*45um 50*60um 70*70um 90*90um 120*120um
Beams Fine multi-beam structure
Materials Pd alloy, Au layered Materials electroplating
Force 1.0 ~ 2.5gf @ 3mil 1.5 ~ 2.5gf @ 3mil 2.0 ~ 3.5gf @ 3mil 2.0 ~ 5.0gf @ 3mil 2.0 ~ 5.0gf @ 3mil
C.C.C.(ISMI) 0.8 ~ 1.5A @ 3mil 1.0 ~ 2.0A @ 3mil 1.5 ~ 2.5A @ 3mil 1.5 ~ 3.0A @ 3mil 3.0 ~ 4.5A @ 3mil

Vertical Probe Pin

  • - Customize beam shape and count = increase C.C.C (20%)
  • - Increase staking layer, precise plating capability
  • - Probe force : able to design per customer’s requirement
  • - Mechanical stress: release bending stress via beam design
Small size pin (<1mm)
Heat resistance
Multi beam
High temp < 150°C

Cross section

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Head

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Beam

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Tail

Stacked layer _17 Laser (PdCo 50 : Au 50)

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