 
 Short buckling probes for high speed test
 
					 
					All the specifications could be optimized upon customer needs
| Length | Min 2.5mm length | 
| Dimension | 50*60um (90um pitch) | 
| Beams | Fine multi-beam structure | 
| Materials | Pd alloy, Au layered Materials electroplating | 
| Options | Insulation coating | 
| Force | 1.5 ~ 3.0 gf @ 3 mil | 
| C.C.C.(ISMI) | 1.0 ~ 2.5A @ 3 mil | 
Multi-beam buckling probes with high performance & Stability
 
					 
					All the specifications could be optimized upon customer needs
| Min pitch | 70um | 90um | 110um | 130um | 150um | 
|---|---|---|---|---|---|
| Dimension | 40*45um | 50*60um | 70*70um | 90*90um | 120*120um | 
| Beams | Fine multi-beam structure | ||||
| Materials | Pd alloy, Au layered Materials electroplating | ||||
| Force | 1.0 ~ 2.5gf @ 3mil | 1.5 ~ 2.5gf @ 3mil | 2.0 ~ 3.5gf @ 3mil | 2.0 ~ 5.0gf @ 3mil | 2.0 ~ 5.0gf @ 3mil | 
| C.C.C.(ISMI) | 0.8 ~ 1.5A @ 3mil | 1.0 ~ 2.0A @ 3mil | 1.5 ~ 2.5A @ 3mil | 1.5 ~ 3.0A @ 3mil | 3.0 ~ 4.5A @ 3mil | 
 
		Vertical Probe Pin
- - Customize beam shape and count = increase C.C.C (20%)
- - Increase staking layer, precise plating capability
- - Probe force : able to design per customer’s requirement
- - Mechanical stress: release bending stress via beam design
Cross section
 
						Head
 
						Beam
 
						Tail
Stacked layer _17 Laser (PdCo 50 : Au 50)
 
					 
									 
						 
						 
						 
						