Short buckling probes for high speed test
All the specifications could be optimized upon customer needs
Length | Min 2.5mm length |
Dimension | 50*60um (90um pitch) |
Beams | Fine multi-beam structure |
Materials | Pd alloy, Au layered Materials electroplating |
Options | Insulation coating |
Force | 1.5 ~ 3.0 gf @ 3 mil |
C.C.C.(ISMI) | 1.0 ~ 2.5A @ 3 mil |
Multi-beam buckling probes with high performance & Stability
All the specifications could be optimized upon customer needs
Min pitch | 70um | 90um | 110um | 130um | 150um |
---|---|---|---|---|---|
Dimension | 40*45um | 50*60um | 70*70um | 90*90um | 120*120um |
Beams | Fine multi-beam structure | ||||
Materials | Pd alloy, Au layered Materials electroplating | ||||
Force | 1.0 ~ 2.5gf @ 3mil | 1.5 ~ 2.5gf @ 3mil | 2.0 ~ 3.5gf @ 3mil | 2.0 ~ 5.0gf @ 3mil | 2.0 ~ 5.0gf @ 3mil |
C.C.C.(ISMI) | 0.8 ~ 1.5A @ 3mil | 1.0 ~ 2.0A @ 3mil | 1.5 ~ 2.5A @ 3mil | 1.5 ~ 3.0A @ 3mil | 3.0 ~ 4.5A @ 3mil |
Vertical Probe Pin
- - Customize beam shape and count = increase C.C.C (20%)
- - Increase staking layer, precise plating capability
- - Probe force : able to design per customer’s requirement
- - Mechanical stress: release bending stress via beam design
Cross section
Head
Beam
Tail
Stacked layer _17 Laser (PdCo 50 : Au 50)